X-ray production simulation of an electron beam recycled through a betatron's internal target

V. V. Kaplin, L. W. Lombardo, A. A. Mihal'chuk, M. A. Piestrup, S. R. Uglov

Результат исследований: Материалы для журналаСтатья

11 Цитирования (Scopus)

Выдержка

An analysis of the circulating dynamics of 6 and 35 MeV electron beams in betatron chambers with quasi-transparent internal targets has been done by means of computer simulation. The spatial and angular distributions of the electron trajectories were studied as the electrons made multiple passes through the thin targets. The beam intensities were observed as a function of the number of passes through 0.01, 0.02, 0.05, and 0.1 mm thick silicon targets. The mean number of passes that an electron makes was determined for each combination of target thickness and beam energy. Using the data obtained from the simulation, the spectral and angular distributions of parametric X-radiation have been calculated for electrons recycled through silicon crystals.

Язык оригиналаАнглийский
Страницы (с-по)244-252
Число страниц9
ЖурналNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Том145
Номер выпуска1-2
DOI
СостояниеОпубликовано - 2 окт 1998

Отпечаток

X ray production
Betatrons
betatrons
Electron beams
electron beams
Electrons
Angular distribution
angular distribution
target thickness
electron trajectories
electrons
x rays
simulation
silicon
Silicon
spatial distribution
computerized simulation
chambers
Spatial distribution
Trajectories

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Цитировать

X-ray production simulation of an electron beam recycled through a betatron's internal target. / Kaplin, V. V.; Lombardo, L. W.; Mihal'chuk, A. A.; Piestrup, M. A.; Uglov, S. R.

В: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Том 145, № 1-2, 02.10.1998, стр. 244-252.

Результат исследований: Материалы для журналаСтатья

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AU - Kaplin, V. V.

AU - Lombardo, L. W.

AU - Mihal'chuk, A. A.

AU - Piestrup, M. A.

AU - Uglov, S. R.

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AB - An analysis of the circulating dynamics of 6 and 35 MeV electron beams in betatron chambers with quasi-transparent internal targets has been done by means of computer simulation. The spatial and angular distributions of the electron trajectories were studied as the electrons made multiple passes through the thin targets. The beam intensities were observed as a function of the number of passes through 0.01, 0.02, 0.05, and 0.1 mm thick silicon targets. The mean number of passes that an electron makes was determined for each combination of target thickness and beam energy. Using the data obtained from the simulation, the spectral and angular distributions of parametric X-radiation have been calculated for electrons recycled through silicon crystals.

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