X-ray diffraction radiation in conditions of Cherenkov effect

A. A. Tishchenko, A. P. Potylitsyn, M. N. Strikhanov

Исследовательская школа физики высокоэнергетических процессов

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

X-ray diffraction radiation from ultra-relativistic electrons moving near an absorbing target is considered. The emission yield is found to increase significantly in conditions of Cherenkov effect.

Язык оригинала	Английский
Страницы (с-по)	509-511
Число страниц	3
Журнал	Physics Letters, Section A: General, Atomic and Solid State Physics
Том	359
Номер выпуска	5
DOI	https://doi.org/10.1016/j.physleta.2006.06.066
Состояние	Опубликовано - 4 дек 2006

ASJC Scopus subject areas

Physics and Astronomy(all)

Доступ к документу

10.1016/j.physleta.2006.06.066

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Цитировать

X-ray diffraction radiation in conditions of Cherenkov effect. / Tishchenko, A. A.; Potylitsyn, A. P.; Strikhanov, M. N.

В: Physics Letters, Section A: General, Atomic and Solid State Physics, Том 359, № 5, 04.12.2006, стр. 509-511.

Результат исследований: Материалы для журнала › Статья › рецензирование

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title = "X-ray diffraction radiation in conditions of Cherenkov effect",

abstract = "X-ray diffraction radiation from ultra-relativistic electrons moving near an absorbing target is considered. The emission yield is found to increase significantly in conditions of Cherenkov effect.",

keywords = "Absorption edge, Diffraction radiation, X-ray Cherenkov radiation",

author = "Tishchenko, {A. A.} and Potylitsyn, {A. P.} and Strikhanov, {M. N.}",

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AU - Tishchenko, A. A.

AU - Potylitsyn, A. P.

AU - Strikhanov, M. N.

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KW - Absorption edge

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