Аннотация
An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
Язык оригинала | Английский |
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Страницы (с-по) | 853-856 |
Число страниц | 4 |
Журнал | Journal of Applied Crystallography |
Том | 48 |
DOI | |
Состояние | Опубликовано - 1 июн 2015 |
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)