X-ray converters for radiation treatment of thin films

V. I. Bespalov, V. V. Ryzhov, I. Yu Turchanovskiǐ

Результат исследований: Материалы для журналаСтатьярецензирование


The energy absorbed in thin films of selected materials bombarded by x rays emitted in the braking of low-energy electrons (E0<500keV) in converters with various atomic numbers (Z=29-73) is calculated by the Monte Carlo method. The program takes into account both of the K-shell ionization mechanisms that lead to emission of characteristic photons as a result of electron impact and as a result of the photoelectric effect, and the characteristic radiation is shown to make a large contribution to the absorbed energy in thin films. Calculations show that the proper choice of material and thickness of the converter affords a two- to fivefold increase in the energy of the x radiation absorbed in thin films of semiconductor materials.

Язык оригиналаАнглийский
Страницы (с-по)1363-1365
Число страниц3
ЖурналTechnical Physics
Номер выпуска11
СостояниеОпубликовано - 1998

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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