USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.

A. D. Pogrebnyak, V. A. Kuz'minykh, K. P. Aref'ev

Результат исследований: Материалы для журналаСтатья

Выдержка

Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.

Язык оригиналаАнглийский
Страницы (с-по)1128-1130
Число страниц3
ЖурналSoviet physics. Technical physics
Том26
Номер выпуска9
СостояниеОпубликовано - сен 1981

Отпечаток

Positron annihilation
surface layer
substrate
Substrates
calculation
material
method

ASJC Scopus subject areas

  • Engineering(all)

Цитировать

USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. / Pogrebnyak, A. D.; Kuz'minykh, V. A.; Aref'ev, K. P.

В: Soviet physics. Technical physics, Том 26, № 9, 09.1981, стр. 1128-1130.

Результат исследований: Материалы для журналаСтатья

Pogrebnyak, AD, Kuz'minykh, VA & Aref'ev, KP 1981, 'USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.', Soviet physics. Technical physics, том. 26, № 9, стр. 1128-1130.
Pogrebnyak, A. D. ; Kuz'minykh, V. A. ; Aref'ev, K. P. / USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. В: Soviet physics. Technical physics. 1981 ; Том 26, № 9. стр. 1128-1130.
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