Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations

Аннотация

This article deals with the models development and FE simulations for mechanical properties of all-metal AFM-TERS tips and electric field enhancement between the tip and the sample. The most important aspects in simulations, the parameters necessary in creating models, and the obtained results are presented and discussed in the article.

Язык оригинала	Английский
Название основной публикации	2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015
Издатель	Institute of Electrical and Electronics Engineers Inc.
ISBN (электронное издание)	9781479999507
DOI	https://doi.org/10.1109/EuroSimE.2015.7103161
Состояние	Опубликовано - 6 мая 2015
Опубликовано для внешнего пользования	Да
Событие	2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015 - Budapest, Венгрия Продолжительность: 19 апр 2015 → 22 апр 2015

Конференция

Конференция	2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015
Страна	Венгрия
Город	Budapest
Период	19.4.15 → 22.4.15

ASJC Scopus subject areas

Computational Theory and Mathematics
Electrical and Electronic Engineering
Control and Systems Engineering
Industrial and Manufacturing Engineering

Доступ к документу

10.1109/EuroSimE.2015.7103161

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Цитировать

Kolchuzhin, V., Mehner, J., Sheremet, E., Kunal, B., Rodriguez, R. D., & Zahn, D. R. T. (2015). Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations. В 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015 [7103161] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuroSimE.2015.7103161

Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations. / Kolchuzhin, Vladimir; Mehner, Jan; Sheremet, Evgeniya; Kunal, Bhattacharya; Rodriguez, Raul D.; Zahn, Dietrich R.T.

2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7103161.

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Kolchuzhin, V, Mehner, J, Sheremet, E, Kunal, B, Rodriguez, RD & Zahn, DRT 2015, Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations. в 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015., 7103161, Institute of Electrical and Electronics Engineers Inc., 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015, Budapest, Венгрия, 19.4.15. https://doi.org/10.1109/EuroSimE.2015.7103161

Kolchuzhin V, Mehner J, Sheremet E, Kunal B, Rodriguez RD, Zahn DRT. Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations. В 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. 7103161 https://doi.org/10.1109/EuroSimE.2015.7103161

Kolchuzhin, Vladimir ; Mehner, Jan ; Sheremet, Evgeniya ; Kunal, Bhattacharya ; Rodriguez, Raul D. ; Zahn, Dietrich R.T. / Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations. 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers Inc., 2015.

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