Transverse beam profile imaging of few-micrometer beam sizes based on a scintillator screen

G. Kube, S. Bajt, A. P. Potylitsyn, L. G. Sukhikh, A. V. Vukolov, I. A. Artyukov, W. Lauth

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

5 Цитирования (Scopus)

Аннотация

Standard beam profile measurements of high–brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the microbunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4t h generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry. In this report, a beam size measurement in the order of a few micrometer is presented using a LYSO scintillator, and discussed in view of the possible achievable resolution.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015
ИздательJoint Accelerator Conferences Website (JACoW)
Страницы330-334
Число страниц5
ISBN (электронное издание)9783954501762
СостояниеОпубликовано - 1 янв 2015
Событие4th International Beam Instrumentation Conference, IBIC 2015 - Melbourne, Австралия
Продолжительность: 13 сен 201517 сен 2015

Серия публикаций

НазваниеProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015

Конференция

Конференция4th International Beam Instrumentation Conference, IBIC 2015
СтранаАвстралия
ГородMelbourne
Период13.9.1517.9.15

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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