Transient thermal nondestructive testing (NDT) of defects in aluminum panels

Xavier Maldague, V. V. Shiryaev, E. Boisvert, Vladimir Vavilov

Центр промышленной томографии

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Аннотация

This paper describes results of the inspection of aluminum specimens by transient infrared thermography. The inspected specimens contain various defects: internal and external corrosion, delaminations and water between two sheets. The accent is made on comparison between scanning IR radiometer and FPA camera, verification of theoretical data by experiment, discrimination between different defects and simple inversion method for corrosion data.

Язык оригинала	Английский
Название основной публикации	Proceedings of SPIE - The International Society for Optical Engineering
Редакторы	Sharon A. Semanovich
Страницы	233-243
Число страниц	11
Том	2473
Состояние	Опубликовано - 1995
Событие	Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, USA Продолжительность: 19 апр 1995 → 21 апр 1995

Другое

Другое	Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Город	Orlando, FL, USA
Период	19.4.95 → 21.4.95

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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Transient thermal nondestructive testing (NDT) of defects in aluminum panels. / Maldague, Xavier; Shiryaev, V. V.; Boisvert, E.; Vavilov, Vladimir.

Proceedings of SPIE - The International Society for Optical Engineering. ред. / Sharon A. Semanovich. Том 2473 1995. стр. 233-243.

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Maldague, X, Shiryaev, VV, Boisvert, E & Vavilov, V 1995, Transient thermal nondestructive testing (NDT) of defects in aluminum panels. в SA Semanovich (ред.), Proceedings of SPIE - The International Society for Optical Engineering. том. 2473, стр. 233-243, Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, Orlando, FL, USA, 19.4.95.

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