Total yield of channeling radiation from relativistic electrons in thin Si and W crystals

Результат исследований: Материалы для журналаСтатья

7 Цитирования (Scopus)


Orientation dependences of channeling radiation total yield from relativistic 155-855 MeV electrons at both h100i axial and (100) planar channeling in thin silicon and tungsten crystals are studied by means of computer simulations. The model as well as computer code developed allows getting the quantitative results for orientation dependence of channeling radiation that can be used for crystal alignment in channeling experiments and/or for diagnostics of initial angular divergence of electron beam.

Язык оригиналаАнглийский
Страницы (с-по)59-62
Число страниц4
ЖурналNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
СостояниеОпубликовано - 1 янв 2013


ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation