Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (112 2) GaN layers grown from the sidewall of an r-patterned sapphire substrate

Sergey Lazarev, Sondes Bauer, Tobias Meisch, Martin Bauer, Ingo Tischer, Mykhailo Barchuk, Klaus Thonke, Vaclav Holy, Ferdinand Scholz, Tilo Baumbach

Результат исследований: Материалы для журналаСтатья

9 Цитирования (Scopus)

Аннотация

Three-dimensional reciprocal space mapping of semipolar ( ) GaN grown on stripe-patterned r-plane ( ) sapphire substrates is found to be a powerful and crucial method for the analysis of diffuse scattering originating from stacking faults that are diffracting in a noncoplanar geometry. Additionally, by measuring three-dimensional reciprocal space maps (3D-RSMs) of several reflections, the transmission electron microscopy visibility criteria could be confirmed. Furthermore, similar to cathodoluminescence, the 3D-RSM method could be used in future as a reliable tool to distinguish clearly between the diffuse scattering signals coming from prismatic and from basal plane stacking faults and from partial dislocations in semipolar ( ) GaN. The fitting of the diffuse scattering intensity profile along the stacking fault streaks with a simulation based on the Monte Carlo approach has delivered an accurate determination of the basal plane stacking fault density. A reduction of the stacking fault density due to the intercalation of an SiN interlayer in the GaN layer deposited on the sidewall of the pre-patterned sapphire substrate has led to an improvement of the optoelectronic properties, influenced by the crystal quality, as has been demonstrated by a locally resolved cathodoluminescence investigation.

Язык оригиналаАнглийский
Страницы (с-по)1425-1433
Число страниц9
ЖурналJournal of Applied Crystallography
Том46
Номер выпуска5
DOI
СостояниеОпубликовано - окт 2013
Опубликовано для внешнего пользованияДа

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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