Three-dimensional analysis of transient thermal NDT problems by data simulation and processing

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

11 Цитирования (Scopus)

Выдержка

The analysis of 2D and 3D numerical models are presented. The thermal nondestructive testing (NDT), it relates to the analysis of a spatial distribution of the temperature that appears over finite size subsurface defects. The ThermoCalc-2D and the ThermoCalc-3D software packages were used to solve the thermal NDT problem.

Язык оригиналаАнглийский
Название основной публикацииProceedings of SPIE - The International Society for Optical Engineering
ИздательSPIE
Страницы152-163
Число страниц12
Том4020
СостояниеОпубликовано - 2000
СобытиеThermosense XXII - Orlando, FL, USA
Продолжительность: 24 апр 200027 апр 2000

Другое

ДругоеThermosense XXII
ГородOrlando, FL, USA
Период24.4.0027.4.00

Отпечаток

dimensional analysis
data simulation
Nondestructive examination
Processing
Software packages
Spatial distribution
Numerical models
spatial distribution
computer programs
Defects
defects
Temperature
temperature
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Цитировать

Vavilov, V. P. (2000). Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. В Proceedings of SPIE - The International Society for Optical Engineering (Том 4020, стр. 152-163). SPIE.

Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. / Vavilov, Vladimir P.

Proceedings of SPIE - The International Society for Optical Engineering. Том 4020 SPIE, 2000. стр. 152-163.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Vavilov, VP 2000, Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. в Proceedings of SPIE - The International Society for Optical Engineering. том. 4020, SPIE, стр. 152-163, Thermosense XXII, Orlando, FL, USA, 24.4.00.
Vavilov VP. Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. В Proceedings of SPIE - The International Society for Optical Engineering. Том 4020. SPIE. 2000. стр. 152-163
Vavilov, Vladimir P. / Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. Proceedings of SPIE - The International Society for Optical Engineering. Том 4020 SPIE, 2000. стр. 152-163
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