Аннотация
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Язык оригинала | Английский |
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Номер статьи | 012003 |
Журнал | Journal of Physics: Conference Series |
Том | 671 |
Номер выпуска | 1 |
DOI | |
Состояние | Опубликовано - 18 янв 2016 |
Событие | 3rd All-Russian Scientific and Practical Conference on Innovations in Non-Destructive Testing, SibTest 2015 - Altai, Российская Федерация Продолжительность: 27 июл 2015 → 31 июл 2015 |
ASJC Scopus subject areas
- Physics and Astronomy(all)