Three-axis MEMS accelerometer for structural inspection

Результат исследований: Материалы для журнала

2 Цитирования (Scopus)


Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.

Язык оригиналаАнглийский
Номер статьи012003
ЖурналJournal of Physics: Conference Series
Номер выпуска1
СостояниеОпубликовано - 18 янв 2016
Событие3rd All-Russian Scientific and Practical Conference on Innovations in Non-Destructive Testing, SibTest 2015 - Altai, Российская Федерация
Продолжительность: 27 июл 201531 июл 2015


ASJC Scopus subject areas

  • Physics and Astronomy(all)