Three-axis MEMS accelerometer for structural inspection

Evgenii Sergeevich Barbin, Aleksei Nikolaevich Koleda, T. Nesterenko, S. Vtorushin

Отделение электронной инженерии

Результат исследований: Материалы для журнала

Аннотация

Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.

Язык оригинала	Английский
Номер статьи	012003
Журнал	Journal of Physics: Conference Series
Том	671
Номер выпуска	1
DOI	https://doi.org/10.1088/1742-6596/671/1/012003
Состояние	Опубликовано - 18 янв 2016
Событие	3rd All-Russian Scientific and Practical Conference on Innovations in Non-Destructive Testing, SibTest 2015 - Altai, Российская Федерация Продолжительность: 27 июл 2015 → 31 июл 2015

ASJC Scopus subject areas

Physics and Astronomy(all)

Доступ к документу

10.1088/1742-6596/671/1/012003

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Цитировать

Barbin, E. S., Koleda, AN., Nesterenko, T., & Vtorushin, S. (2016). Three-axis MEMS accelerometer for structural inspection. Journal of Physics: Conference Series, 671(1), [012003]. https://doi.org/10.1088/1742-6596/671/1/012003

@article{44d5be014a40472ba410dd0553dd71bc,

title = "Three-axis MEMS accelerometer for structural inspection",

abstract = "Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.",

author = "Barbin, {Evgenii Sergeevich} and Aleksei Nikolaevich Koleda and T. Nesterenko and S. Vtorushin",

year = "2016",

month = jan,

day = "18",

doi = "10.1088/1742-6596/671/1/012003",

language = "English",

volume = "671",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "3rd All-Russian Scientific and Practical Conference on Innovations in Non-Destructive Testing, SibTest 2015 ; Conference date: 27-07-2015 Through 31-07-2015",

}

TY - JOUR

T1 - Three-axis MEMS accelerometer for structural inspection

AU - Barbin, Evgenii Sergeevich

AU - Koleda, Aleksei Nikolaevich

AU - Nesterenko, T.

AU - Vtorushin, S.

PY - 2016/1/18

Y1 - 2016/1/18

N2 - Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.

AB - Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.

UR - http://www.scopus.com/inward/record.url?scp=84960153852&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84960153852&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/671/1/012003

DO - 10.1088/1742-6596/671/1/012003

M3 - Conference article

AN - SCOPUS:84960153852

VL - 671

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012003

T2 - 3rd All-Russian Scientific and Practical Conference on Innovations in Non-Destructive Testing, SibTest 2015

Y2 - 27 July 2015 through 31 July 2015

ER -