Possibilities of increasing tauz (the time before dendrite orinigation and taubr (the time before break-down) of specimen with coaxial electrode system were investigated using thin barrier layers with high epsilonp (Dielectic Permittivity) in particular in high voltage flexible rubber isolated cables. The tests were conducted in the electode system cusp - plane on mock-up specimen made of polymethylmethacrylate, low density polythene and cold-solidified epoxide compounds. The impact of high dielectric permittivity barriers can be observed only in cass of durable voltage action and it is increaning in accordance with the epsilonp/epsilonmi growth. (Epsilonmi - dielectric constant of main insulation).
|Состояние||Опубликовано - янв 1991|
ASJC Scopus subject areas
- Electrical and Electronic Engineering