The breakdown study of three-layer solid dielectrics

D. P. Agoris, V. I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

3 Цитирования (Scopus)

Выдержка

The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

Язык оригиналаАнглийский
Название основной публикацииIEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Страницы434-437
Число страниц4
СостояниеОпубликовано - 2001
Событие7th International Conference on Solid Dielectrics - Eindhoven, Нидерланды
Продолжительность: 25 июн 2001 → 29 июн 2001

Другое

Другое7th International Conference on Solid Dielectrics
СтранаНидерланды
ГородEindhoven
Период25.6.01 → 29.6.01

Отпечаток

Electric breakdown
Permittivity
Electric fields
Polarization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Цитировать

Agoris, D. P., Chichikin, V. I., Gefle, O. S., Lebedev, S. M., & Vitellas, I. (2001). The breakdown study of three-layer solid dielectrics. В IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (стр. 434-437)

The breakdown study of three-layer solid dielectrics. / Agoris, D. P.; Chichikin, V. I.; Gefle, O. S.; Lebedev, S. M.; Vitellas, I.

IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. стр. 434-437.

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Agoris, DP, Chichikin, VI, Gefle, OS, Lebedev, SM & Vitellas, I 2001, The breakdown study of three-layer solid dielectrics. в IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. стр. 434-437, Eindhoven, Нидерланды, 25.6.01.
Agoris DP, Chichikin VI, Gefle OS, Lebedev SM, Vitellas I. The breakdown study of three-layer solid dielectrics. В IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. стр. 434-437
Agoris, D. P. ; Chichikin, V. I. ; Gefle, O. S. ; Lebedev, S. M. ; Vitellas, I. / The breakdown study of three-layer solid dielectrics. IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. стр. 434-437
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