The breakdown study of three-layer solid dielectrics

D. P. Agoris, V. I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

Научно-образовательный центр "Технологии космического материаловедения"

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Аннотация

The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

Язык оригинала	Английский
Название основной публикации	IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Страницы	434-437
Число страниц	4
Состояние	Опубликовано - 2001
Событие	7th International Conference on Solid Dielectrics - Eindhoven, Нидерланды Продолжительность: 25 июн 2001 → 29 июн 2001

Другое

Другое	7th International Conference on Solid Dielectrics
Страна	Нидерланды
Город	Eindhoven
Период	25.6.01 → 29.6.01

ASJC Scopus subject areas

Electrical and Electronic Engineering

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The breakdown study of three-layer solid dielectrics. / Agoris, D. P.; Chichikin, V. I.; Gefle, O. S.; Lebedev, S. M.; Vitellas, I.

IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. стр. 434-437.

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

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