Аннотация
The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.
| Язык оригинала | Английский |
|---|---|
| Название основной публикации | IEEE International Conference on Conduction and Breakdown in Solid Dielectrics |
| Страницы | 434-437 |
| Число страниц | 4 |
| Состояние | Опубликовано - 2001 |
| Событие | 7th International Conference on Solid Dielectrics - Eindhoven, Нидерланды Продолжительность: 25 июн 2001 → 29 июн 2001 |
Другое
| Другое | 7th International Conference on Solid Dielectrics |
|---|---|
| Страна | Нидерланды |
| Город | Eindhoven |
| Период | 25.6.01 → 29.6.01 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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Цитировать
Agoris, D. P., Chichikin, V. I., Gefle, O. S., Lebedev, S. M., & Vitellas, I. (2001). The breakdown study of three-layer solid dielectrics. В IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (стр. 434-437)