The breakdown study of three-layer solid dielectrics

D. P. Agoris, V. I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

Результат исследования: Материалы для книги/типы отчетовМатериалы для конференции

3 Цитирования (Scopus)

Аннотация

The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

Язык оригиналаАнглийский
Заголовок главной публикацииIEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Страницы434-437
Количество страниц4
Статус публикацииОпубликовано - 2001
Событие7th International Conference on Solid Dielectrics - Eindhoven, Нидерланды
Длительность: 25 июн 200129 июн 2001

Другое

Другое7th International Conference on Solid Dielectrics
СтранаНидерланды
ГородEindhoven
Период25.6.0129.6.01

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Цитировать

Agoris, D. P., Chichikin, V. I., Gefle, O. S., Lebedev, S. M., & Vitellas, I. (2001). The breakdown study of three-layer solid dielectrics. В IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (стр. 434-437)