Synthesis of nanosized silicon carbide in a free expiring plasma jet

Аннотация

Silicon carbide (SiC) nanomaterials can be successfully used for ceramics production and semiconductor applications. The possibility of the SiC nanopowder synthesis in an electrodischarge silicon-carbon plasma jet generated by a pulsed coaxial magnetoplasma accelerator (CMPA) is shown in this paper. A plasma jet expired in a free space of a reactor chamber filled with argon. The synthesized product was analyzed without any preparation by some modern techniques such as X-ray diffraction, scanning and transmission electron microscopy. The resulting product was compared with nanopowders synthesized in a plasma flow influencing on a copper barrier.

Язык оригинала	Английский
Название основной публикации	2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Proceedings
Издатель	Institute of Electrical and Electronics Engineers Inc.
ISBN (печатное издание)	9781479971022
DOI	https://doi.org/10.1109/SIBCON.2015.7147160
Состояние	Опубликовано - 1 июл 2015
Событие	2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Omsk, Российская Федерация Продолжительность: 21 мая 2015 → 23 мая 2015

Другое

Другое	2015 International Siberian Conference on Control and Communications, SIBCON 2015
Страна	Российская Федерация
Город	Omsk
Период	21.5.15 → 23.5.15

ASJC Scopus subject areas

Computer Networks and Communications
Control and Systems Engineering

Доступ к документу

10.1109/SIBCON.2015.7147160

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Цитировать

Synthesis of nanosized silicon carbide in a free expiring plasma jet. / Nikitin, Dmitry Sergeevich ; Sivkov, A.; Pak, A.; Shanenkova, Yu ; Ivashutenko, A.

2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. 7147160.

Результат исследований: Материалы для книги/типы отчетов › Материалы для конференции

Nikitin, DS , Sivkov, A , Pak, A , Shanenkova, Y & Ivashutenko, A 2015, Synthesis of nanosized silicon carbide in a free expiring plasma jet. в 2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Proceedings., 7147160, Institute of Electrical and Electronics Engineers Inc., 2015 International Siberian Conference on Control and Communications, SIBCON 2015, Omsk, Российская Федерация, 21.5.15. https://doi.org/10.1109/SIBCON.2015.7147160

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abstract = "Silicon carbide (SiC) nanomaterials can be successfully used for ceramics production and semiconductor applications. The possibility of the SiC nanopowder synthesis in an electrodischarge silicon-carbon plasma jet generated by a pulsed coaxial magnetoplasma accelerator (CMPA) is shown in this paper. A plasma jet expired in a free space of a reactor chamber filled with argon. The synthesized product was analyzed without any preparation by some modern techniques such as X-ray diffraction, scanning and transmission electron microscopy. The resulting product was compared with nanopowders synthesized in a plasma flow influencing on a copper barrier.",

keywords = "coaxial magnetoplasma accelerator, plasmodynamic synthesis, silicon carbide, transmission electron microscopy, X-ray diffractometry",

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AU - Nikitin, Dmitry Sergeevich

AU - Sivkov, A.

AU - Pak, A.

AU - Shanenkova, Yu

AU - Ivashutenko, A.

PY - 2015/7/1

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AB - Silicon carbide (SiC) nanomaterials can be successfully used for ceramics production and semiconductor applications. The possibility of the SiC nanopowder synthesis in an electrodischarge silicon-carbon plasma jet generated by a pulsed coaxial magnetoplasma accelerator (CMPA) is shown in this paper. A plasma jet expired in a free space of a reactor chamber filled with argon. The synthesized product was analyzed without any preparation by some modern techniques such as X-ray diffraction, scanning and transmission electron microscopy. The resulting product was compared with nanopowders synthesized in a plasma flow influencing on a copper barrier.

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KW - silicon carbide

KW - transmission electron microscopy

KW - X-ray diffractometry

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