Аннотация
X-ray Photoelectron Spectroscopy (XPS) was used to investigate the chemical state of ZrC coatings deposited by cathodic arc method. A chemistry model of the ZrC films has been proposed. It was pointed out that on the films surface a highly oxidized passive layer, containing also carbon and oxygen as contaminants, was formed. The film bulk was composed by a mixture of ZrC (the dominant phase), ZrO2 and free carbon.
Язык оригинала | Английский |
---|---|
Страницы (с-по) | 2557-2560 |
Число страниц | 4 |
Журнал | Journal of Optoelectronics and Advanced Materials |
Том | 7 |
Номер выпуска | 5 |
Состояние | Опубликовано - 1 окт 2005 |
Опубликовано для внешнего пользования | Да |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering