Subjective remarks on the terminology used in thermal/infrared nondestructive testing

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

5 Цитирования (Scopus)

Выдержка

The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

Язык оригиналаАнглийский
Название основной публикацииProceedings of SPIE - The International Society for Optical Engineering
РедакторыDouglas D. Burleigh, Jane W. Spicer
Страницы276-281
Число страниц6
Том2766
СостояниеОпубликовано - 1996
СобытиеThermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, USA
Продолжительность: 10 апр 199612 апр 1996

Другое

ДругоеThermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
ГородOrlando, FL, USA
Период10.4.9612.4.96

Отпечаток

terminology
Terminology
Nondestructive examination
Infrared radiation
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Цитировать

Vavilov, V. P. (1996). Subjective remarks on the terminology used in thermal/infrared nondestructive testing. В D. D. Burleigh, & J. W. Spicer (Ред.), Proceedings of SPIE - The International Society for Optical Engineering (Том 2766, стр. 276-281)

Subjective remarks on the terminology used in thermal/infrared nondestructive testing. / Vavilov, Vladimir P.

Proceedings of SPIE - The International Society for Optical Engineering. ред. / Douglas D. Burleigh; Jane W. Spicer. Том 2766 1996. стр. 276-281.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Vavilov, VP 1996, Subjective remarks on the terminology used in thermal/infrared nondestructive testing. в DD Burleigh & JW Spicer (ред.), Proceedings of SPIE - The International Society for Optical Engineering. том. 2766, стр. 276-281, Orlando, FL, USA, 10.4.96.
Vavilov VP. Subjective remarks on the terminology used in thermal/infrared nondestructive testing. В Burleigh DD, Spicer JW, редакторы, Proceedings of SPIE - The International Society for Optical Engineering. Том 2766. 1996. стр. 276-281
Vavilov, Vladimir P. / Subjective remarks on the terminology used in thermal/infrared nondestructive testing. Proceedings of SPIE - The International Society for Optical Engineering. редактор / Douglas D. Burleigh ; Jane W. Spicer. Том 2766 1996. стр. 276-281
@inproceedings{eb61c4a4dd024091a5d55a26b01c4f1f,
title = "Subjective remarks on the terminology used in thermal/infrared nondestructive testing",
abstract = "The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.",
author = "Vavilov, {Vladimir P.}",
year = "1996",
language = "English",
isbn = "0819421472",
volume = "2766",
pages = "276--281",
editor = "Burleigh, {Douglas D.} and Spicer, {Jane W.}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - Subjective remarks on the terminology used in thermal/infrared nondestructive testing

AU - Vavilov, Vladimir P.

PY - 1996

Y1 - 1996

N2 - The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

AB - The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

UR - http://www.scopus.com/inward/record.url?scp=0029713683&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029713683&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029713683

SN - 0819421472

SN - 9780819421470

VL - 2766

SP - 276

EP - 281

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Burleigh, Douglas D.

A2 - Spicer, Jane W.

ER -