Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation

A. Aryshev, N. Terunuma, J. Urakawa, S. T. Boogert, P. Karataev, D. Howell

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

Optical Transition Radiation (OTR) appears when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the Point Spread Function (PSF) dimension - The source distribution generated by a single electron and projected by an optical system onto a screen. For small electron beam dimensions, the PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations, etc. In our experiment we managed to create a system which can practically measure the PSF distribution and using a new self-calibration method we are able to calculate transverse electron beam size. Here we represent the development, data analysis and novel calibration technique of a sub-micrometer electron beam profile monitor based on the measurements of the PSF shape, which visibility is sensitive to sub-micrometer electron beam dimensions.

Язык оригиналаАнглийский
Название основной публикацииIPAC 2011 - 2nd International Particle Accelerator Conference
Страницы1964-1966
Число страниц3
СостояниеОпубликовано - 2011
Опубликовано для внешнего пользованияДа
Событие2nd International Particle Accelerator Conference, IPAC 2011 - Kursaal, San Sebastian, Испания
Продолжительность: 4 сен 20119 сен 2011

Конференция

Конференция2nd International Particle Accelerator Conference, IPAC 2011
СтранаИспания
ГородKursaal, San Sebastian
Период4.9.119.9.11

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

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  • Цитировать

    Aryshev, A., Terunuma, N., Urakawa, J., Boogert, S. T., Karataev, P., & Howell, D. (2011). Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. В IPAC 2011 - 2nd International Particle Accelerator Conference (стр. 1964-1966)