Structural levels of plastic deformation and fracture of coated materials under different schemes of external loading

S. V. Panin, A. Yu Bydzan, Sh A. Baibulatov, N. N. Korobkina

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The paper reports on results of experimental investigations of mesoscale plastic deformation development in coated and surface-hardened materials. Plastic flow evolution under different schemes of loading is considered from structural levels of plastic deformation and failure point of view. It is shown that coating-substrate interface under loading is the site of powerful stress concentrators emergence whose action results in formation of localized deformation bands, cracks and, finally, material failure.

Язык оригиналаАнглийский
Название основной публикации5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы277-280
Число страниц4
Том1
ISBN (печатное издание)0780370082, 9780780370081
DOI
СостояниеОпубликовано - 2001
Событие5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Российская Федерация
Продолжительность: 26 июн 20013 июл 2001

Другое

Другое5th Korea-Russia International Symposium on Science and Technology, KORUS 2001
СтранаРоссийская Федерация
ГородTomsk
Период26.6.013.7.01

ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

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    Panin, S. V., Bydzan, A. Y., Baibulatov, S. A., & Korobkina, N. N. (2001). Structural levels of plastic deformation and fracture of coated materials under different schemes of external loading. В 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 (Том 1, стр. 277-280). [975123] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2001.975123