Structural-difractional analysis of zirconium dioxide nanometric powders

Yu F. Ivanov, N. V. Dedov

Результат исследований: Материалы для журналаСтатья

5 Цитирования (Scopus)

Выдержка

Using transmission electron microscopy and diffraction method studies of zirconium dioxide powders prepared by plasma-chemical deposition of thin films were carried out. In films having the average crystalline size less than 6-8 nm high contact elastic stresses resulting in continuous change of the material lattice parameter near crystalline boundaries appear. Due to these stresses relaxation under γ-irradiation a number of metastable states of zirconium dioxide crystalline lattice is formed.

Язык оригиналаАнглийский
Страницы (с-по)117-122
Число страниц6
ЖурналFizika i Khimiya Obrabotki Materialov
Номер выпуска1
СостояниеОпубликовано - янв 1995

Отпечаток

Zirconium
Structural analysis
Powders
Crystalline materials
Stress relaxation
Electron diffraction
Crystal lattices
Lattice constants
Irradiation
Transmission electron microscopy
Plasmas
Thin films
zirconium oxide

ASJC Scopus subject areas

  • Materials Science(all)

Цитировать

Structural-difractional analysis of zirconium dioxide nanometric powders. / Ivanov, Yu F.; Dedov, N. V.

В: Fizika i Khimiya Obrabotki Materialov, № 1, 01.1995, стр. 117-122.

Результат исследований: Материалы для журналаСтатья

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