Electron diffraction microscopy of thin foils is used to study the defect substructure of armco iron subjected to equal channel angular extrusion at room temperature, using the processing route A. The morphology of the defect substructure is shown to be substantially affected by the section plane of the billets. The results obtained suggest that the evolution of the defect substructure of the material subjected to equal channel angular extrusion is clearly revealed only by examining no fewer than three mutually perpendicular section planes.
ASJC Scopus subject areas
- Physics and Astronomy(all)