Statistical Regularity in LTD Technology

A. A. Kim, V. M. Alexeenko, S. S. Kondratiev, V. A. Sinebrukhov

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Выдержка

    In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.

    Язык оригиналаАнглийский
    Название основной публикацииProceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018
    ИздательInstitute of Electrical and Electronics Engineers Inc.
    Страницы70-73
    Число страниц4
    ISBN (электронное издание)9781538668900
    DOI
    СостояниеОпубликовано - 2 ноя 2018
    Событие20th International Symposium on High-Current Electronics, ISHCE 2018 - Tomsk, Российская Федерация
    Продолжительность: 16 сен 201822 сен 2018

    Конференция

    Конференция20th International Symposium on High-Current Electronics, ISHCE 2018
    СтранаРоссийская Федерация
    ГородTomsk
    Период16.9.1822.9.18

    Отпечаток

    Jitter
    regularity
    spark gaps
    switches
    bricks
    Switches
    Brick
    Electric sparks
    vibration
    cavities
    modules
    closures
    simulation
    computer programs
    output
    pulses

    ASJC Scopus subject areas

    • Safety, Risk, Reliability and Quality
    • Instrumentation
    • Electrical and Electronic Engineering

    Цитировать

    Kim, A. A., Alexeenko, V. M., Kondratiev, S. S., & Sinebrukhov, V. A. (2018). Statistical Regularity in LTD Technology. В Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018 (стр. 70-73). [8521228] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISHCE.2018.8521228

    Statistical Regularity in LTD Technology. / Kim, A. A.; Alexeenko, V. M.; Kondratiev, S. S.; Sinebrukhov, V. A.

    Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 70-73 8521228.

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Kim, AA, Alexeenko, VM, Kondratiev, SS & Sinebrukhov, VA 2018, Statistical Regularity in LTD Technology. в Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018., 8521228, Institute of Electrical and Electronics Engineers Inc., стр. 70-73, 20th International Symposium on High-Current Electronics, ISHCE 2018, Tomsk, Российская Федерация, 16.9.18. https://doi.org/10.1109/ISHCE.2018.8521228
    Kim AA, Alexeenko VM, Kondratiev SS, Sinebrukhov VA. Statistical Regularity in LTD Technology. В Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc. 2018. стр. 70-73. 8521228 https://doi.org/10.1109/ISHCE.2018.8521228
    Kim, A. A. ; Alexeenko, V. M. ; Kondratiev, S. S. ; Sinebrukhov, V. A. / Statistical Regularity in LTD Technology. Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 70-73
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