Soft component of emission from channeled electrons in a silicon crystal

I. E. Vnukov, B. N. Kalinin, A. A. Kiryakov, G. A. Naumenko, D. V. Padalko, A. P. Potylitsyn

Результат исследований: Материалы для журналаСтатья

3 Цитирования (Scopus)

Аннотация

The Tomsk synchrotron has been used to measure the emission spectrum and orientation dependences of the yield of photons with energies much smaller than the emission energy of channeled electrons. The measurements have been performed with a crystal-diffraction spectrometer. For electrons incident along the (110) axis, the radiation intensity in the energy range 30 ≤ ω ≤ 360 keV exceeds the bremsstrahlung one by almost an order of magnitude. The shape of the emission spectrum does not coincide with that of the bremsstrahlung spectrum. The radiation intensity increases smoothly with the photon energy. The bremsstrahlung spectrum from a disoriented crystalline target is satisfactorily described by the existing theory with phenomenological consideration of the polarization of the medium.

Язык оригиналаАнглийский
Страницы (с-по)281-291
Число страниц11
ЖурналRussian Physics Journal
Том44
Номер выпуска3
DOI
СостояниеОпубликовано - 1 янв 2001

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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