SIR based SSC over correlated κ - μ fading channels

Stefan Panic, Hranislav Milosevic, Caslav Stefanovic, Vladeta Milenkovic

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

1 Цитирования (Scopus)

Аннотация

Signal-to-interference ratio (SIR) based switch-and-stay combining (SSC) diversity system over correlated κ - μ fading channels, in the presence of correlated co-channel interferers (CCI) is observed. Appropriate closed-form expressions for probability density function (PDF), and cumulative distribution function (CDF) of the SSC output SIR are derived. Capitalizing on them, important performance measure, outage probability (OP), is efficiently evaluated, and analyzed for various values of propagation parameters.

Язык оригиналаАнглийский
Название основной публикации2017 13th International Wireless Communications and Mobile Computing Conference, IWCMC 2017
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы582-586
Число страниц5
ISBN (электронное издание)9781509043729
DOI
СостояниеОпубликовано - 19 июл 2017
Опубликовано для внешнего пользованияДа
Событие13th IEEE International Wireless Communications and Mobile Computing Conference, IWCMC 2017 - Valencia, Испания
Продолжительность: 26 июн 201730 июн 2017

Серия публикаций

Название2017 13th International Wireless Communications and Mobile Computing Conference, IWCMC 2017

Конференция

Конференция13th IEEE International Wireless Communications and Mobile Computing Conference, IWCMC 2017
СтранаИспания
ГородValencia
Период26.6.1730.6.17

    Fingerprint

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Signal Processing

Цитировать

Panic, S., Milosevic, H., Stefanovic, C., & Milenkovic, V. (2017). SIR based SSC over correlated κ - μ fading channels. В 2017 13th International Wireless Communications and Mobile Computing Conference, IWCMC 2017 (стр. 582-586). [7986350] (2017 13th International Wireless Communications and Mobile Computing Conference, IWCMC 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWCMC.2017.7986350