Simulation of transition radiation based beam imaging from tilted targets

Результат исследований: Материалы для журналаСтатья

3 Цитирования (Scopus)

Выдержка

Transverse beam profile diagnostics in linear electron accelerators is usually based on direct imaging of a beam spot via visible transition radiation. In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to measure beam sizes beyond the diffraction limit is to perform imaging dominated by a single-particle function (SPF), i.e. when the recorded image is dominated not by the transverse beam profile but by the image function of a point source (single electron). Knowledge of the SPF for an experimental setup allows one to extract the transverse beam size from an SPF dominated image. This paper presents an approach that allows one to calculate two-dimensional SPF dominated beam images, taking into account the target inclination angle and the depth-of-field effect. In conclusion, a simple fit function for beam size determination in the case under consideration is proposed and its applicability is tested under various conditions.

Язык оригиналаАнглийский
Номер статьи032802
ЖурналPhysical Review Accelerators and Beams
Том20
Номер выпуска3
DOI
СостояниеОпубликовано - 15 мар 2017

Отпечаток

radiation
simulation
diffraction radiation
size determination
electron accelerators
profiles
point sources
inclination
diffraction
electrons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Nuclear and High Energy Physics
  • Surfaces and Interfaces

Цитировать

Simulation of transition radiation based beam imaging from tilted targets. / Sukhikh, L. G.; Kube, G.; Potylitsyn, A. P.

В: Physical Review Accelerators and Beams, Том 20, № 3, 032802, 15.03.2017.

Результат исследований: Материалы для журналаСтатья

@article{46ee5879ff4a4a4289069103c7f03c9a,
title = "Simulation of transition radiation based beam imaging from tilted targets",
abstract = "Transverse beam profile diagnostics in linear electron accelerators is usually based on direct imaging of a beam spot via visible transition radiation. In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to measure beam sizes beyond the diffraction limit is to perform imaging dominated by a single-particle function (SPF), i.e. when the recorded image is dominated not by the transverse beam profile but by the image function of a point source (single electron). Knowledge of the SPF for an experimental setup allows one to extract the transverse beam size from an SPF dominated image. This paper presents an approach that allows one to calculate two-dimensional SPF dominated beam images, taking into account the target inclination angle and the depth-of-field effect. In conclusion, a simple fit function for beam size determination in the case under consideration is proposed and its applicability is tested under various conditions.",
author = "Sukhikh, {L. G.} and G. Kube and Potylitsyn, {A. P.}",
year = "2017",
month = "3",
day = "15",
doi = "10.1103/PhysRevAccelBeams.20.032802",
language = "English",
volume = "20",
journal = "Physical Review Accelerators and Beams",
issn = "2469-9888",
publisher = "American Physical Society",
number = "3",

}

TY - JOUR

T1 - Simulation of transition radiation based beam imaging from tilted targets

AU - Sukhikh, L. G.

AU - Kube, G.

AU - Potylitsyn, A. P.

PY - 2017/3/15

Y1 - 2017/3/15

N2 - Transverse beam profile diagnostics in linear electron accelerators is usually based on direct imaging of a beam spot via visible transition radiation. In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to measure beam sizes beyond the diffraction limit is to perform imaging dominated by a single-particle function (SPF), i.e. when the recorded image is dominated not by the transverse beam profile but by the image function of a point source (single electron). Knowledge of the SPF for an experimental setup allows one to extract the transverse beam size from an SPF dominated image. This paper presents an approach that allows one to calculate two-dimensional SPF dominated beam images, taking into account the target inclination angle and the depth-of-field effect. In conclusion, a simple fit function for beam size determination in the case under consideration is proposed and its applicability is tested under various conditions.

AB - Transverse beam profile diagnostics in linear electron accelerators is usually based on direct imaging of a beam spot via visible transition radiation. In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to measure beam sizes beyond the diffraction limit is to perform imaging dominated by a single-particle function (SPF), i.e. when the recorded image is dominated not by the transverse beam profile but by the image function of a point source (single electron). Knowledge of the SPF for an experimental setup allows one to extract the transverse beam size from an SPF dominated image. This paper presents an approach that allows one to calculate two-dimensional SPF dominated beam images, taking into account the target inclination angle and the depth-of-field effect. In conclusion, a simple fit function for beam size determination in the case under consideration is proposed and its applicability is tested under various conditions.

UR - http://www.scopus.com/inward/record.url?scp=85025466551&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85025466551&partnerID=8YFLogxK

U2 - 10.1103/PhysRevAccelBeams.20.032802

DO - 10.1103/PhysRevAccelBeams.20.032802

M3 - Article

AN - SCOPUS:85025466551

VL - 20

JO - Physical Review Accelerators and Beams

JF - Physical Review Accelerators and Beams

SN - 2469-9888

IS - 3

M1 - 032802

ER -