Nowadays growth of synthetic crystals is a very prospective direction of research activity. However, it is well known that in synthesized crystals there are still many defects and the main idea is to synthesize crystal of ideal form and structure. But in purpose to remove defects first you have to characterize them. This paper describes the method for the characterization of such defects and mainly concentrates on the problem of sample alignment procedure, offering the way to avoid misalignments.
|Журнал||IOP Conference Series: Materials Science and Engineering|
|Состояние||Опубликовано - 2 сен 2016|
|Событие||7th International Scientific Practical Conference on Innovative Technologies in Engineering - Yurga, Российская Федерация|
Продолжительность: 19 мая 2016 → 21 мая 2016
ASJC Scopus subject areas
- Materials Science(all)