Simulation of the formation of a runaway electron beam in an overvolted gas gap breakdown

Valery Alexandrovich Shklyaev, S. Ya Belomyttsev, V. V. Ryzhov

Результат исследований: Материалы для журнала › Статья

18 Цитирования (Scopus)

Выдержка

The paper reports on numerical simulation to inquire into the breakdown of a gas-filled diode in a highly inhomogeneous electric field. It is shown that early in the breakdown a runaway electron beam (RAEB) is formed in the diode and this strongly affects the rate of breakdown development. The energy gained by RAEB electrons corresponds to the electron energy gained under the same conditions in vacuum. The properties of the emission surface of the cathode determine the instant at which the beam is formed during subnanosecond voltage pulse rise time and hence the beam current and the energy spectrum of runaway electrons.

Язык оригиналаАнглийский
Номер статьи113303
ЖурналJournal of Applied Physics
Том112
Номер выпуска11
DOI
СостояниеОпубликовано - 1 дек 2012

Отпечаток

breakdown
electron beams
diodes
gases
simulation
beam currents
energy spectra
cathodes
electron energy
vacuum
electric fields
electric potential
pulses
electrons
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Цитировать

Simulation of the formation of a runaway electron beam in an overvolted gas gap breakdown. / Shklyaev, Valery Alexandrovich; Belomyttsev, S. Ya; Ryzhov, V. V.

В: Journal of Applied Physics, Том 112, № 11, 113303, 01.12.2012.

Результат исследований: Материалы для журнала › Статья

Shklyaev, VA, Belomyttsev, SY & Ryzhov, VV 2012, 'Simulation of the formation of a runaway electron beam in an overvolted gas gap breakdown', Journal of Applied Physics, том. 112, № 11, 113303. https://doi.org/10.1063/1.4768912
Shklyaev VA, Belomyttsev SY, Ryzhov VV. Simulation of the formation of a runaway electron beam in an overvolted gas gap breakdown. Journal of Applied Physics. 2012 Дек. 1;112(11). 113303. https://doi.org/10.1063/1.4768912
Shklyaev, Valery Alexandrovich ; Belomyttsev, S. Ya ; Ryzhov, V. V. / Simulation of the formation of a runaway electron beam in an overvolted gas gap breakdown. В: Journal of Applied Physics. 2012 ; Том 112, № 11.
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