Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities

I. V. Minin, Oleg V. Minin, Dmitry O. Golodnikov

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

1 цитирование (Scopus)

Выдержка

The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.

Язык оригиналаАнглийский
Название основной публикации2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006
Страницы13-18
Число страниц6
DOI
СостояниеОпубликовано - 2006
Опубликовано для внешнего пользованияДа
Событие8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006 - Novosibirsk, Российская Федерация
Продолжительность: 26 сен 200628 сен 2006

Конференция

Конференция8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006
СтранаРоссийская Федерация
ГородNovosibirsk
Период26.9.0628.9.06

Отпечаток

Diffractive optics
Permittivity
Microwaves
Infrared radiation
Wavelength
Materials testing
Dielectric properties
Monitoring
Chemical analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Цитировать

Minin, I. V., Minin, O. V., & Golodnikov, D. O. (2006). Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. В 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006 (стр. 13-18). [4292375] https://doi.org/10.1109/APEIE.2006.4292375

Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. / Minin, I. V.; Minin, Oleg V.; Golodnikov, Dmitry O.

2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. стр. 13-18 4292375.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Minin, IV, Minin, OV & Golodnikov, DO 2006, Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. в 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006., 4292375, стр. 13-18, 8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006, Novosibirsk, Российская Федерация, 26.9.06. https://doi.org/10.1109/APEIE.2006.4292375
Minin IV, Minin OV, Golodnikov DO. Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. В 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. стр. 13-18. 4292375 https://doi.org/10.1109/APEIE.2006.4292375
Minin, I. V. ; Minin, Oleg V. ; Golodnikov, Dmitry O. / Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. стр. 13-18
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