Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components

S. P. Osipov, E. Yu Usachev, S. V. Chakhlov, S. A. Shchetinkin, E. N. Kamysheva

Результат исследований: Материалы для журналаСтатья

1 Цитирования (Scopus)

Аннотация

An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV.

Язык оригиналаАнглийский
Страницы (с-по)797-810
Число страниц14
ЖурналRussian Journal of Nondestructive Testing
Том54
Номер выпуска11
DOI
СостояниеОпубликовано - 1 ноя 2018

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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