Quasi-optical material measurements with help of diffractive optics

I. V. Minin, Oleg V. Minin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.

Язык оригиналаАнглийский
Название основной публикацииIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics
Страницы301
Число страниц1
DOI
СостояниеОпубликовано - 2006
Опубликовано для внешнего пользованияДа
СобытиеIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics - Shanghai, Китай
Продолжительность: 18 сен 200622 сен 2006

Конференция

КонференцияIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics
СтранаКитай
ГородShanghai
Период18.9.0622.9.06

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Цитировать

Minin, I. V., & Minin, O. V. (2006). Quasi-optical material measurements with help of diffractive optics. В IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics (стр. 301). [4222243] https://doi.org/10.1109/ICIMW.2006.368509