Quality control of ZnGeP₂ single crystals using optical methods

V. V. Dyomin, I. G. Polovtsev, D. V. Kamenev

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

A method for detection of subsurface defects in ZnGeP2 crystals is proposed. Evaluation of this method is performed and experimental results are presented.

Язык оригинала	Английский
Страницы (с-по)	1479-1481
Число страниц	3
Журнал	Russian Physics Journal
Том	58
Номер выпуска	10
DOI	https://doi.org/10.1007/s11182-016-0672-4
Состояние	Опубликовано - 1 фев 2016
Опубликовано для внешнего пользования	Да

ASJC Scopus subject areas

Physics and Astronomy(all)

Доступ к документу

10.1007/s11182-016-0672-4

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abstract = "A method for detection of subsurface defects in ZnGeP2 crystals is proposed. Evaluation of this method is performed and experimental results are presented.",

keywords = "Detection of defects, Optical techniques, ZnGeP crystals",

author = "Dyomin, {V. V.} and Polovtsev, {I. G.} and Kamenev, {D. V.}",

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