Аннотация
The anniilation photon angular distribution (APAD) for double-layer samples is measured. The minimum foil thickness of materials of various effective atomic numbers on the semiconductor GaAs support is determined. Their structure can be studied by the positron-spectroscopy method with the **2**2Na( beta ** plus , gamma ) emitter.
Язык оригинала | Английский |
---|---|
Страницы (с-по) | 145-151 |
Число страниц | 7 |
Журнал | Physica Status Solidi (A) Applied Research |
Том | 71 |
Номер выпуска | 1 |
Состояние | Опубликовано - мая 1982 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics