POSITRON PROFILES AND POSITRON ANNIHILATION IN THIN LAYERS.

A. D. Pogrebnyak, V. A. Kuzminikh, K. P. Arefev

Отделение математики и информатики

Результат исследований: Материалы для журнала › Статья

Аннотация

The anniilation photon angular distribution (APAD) for double-layer samples is measured. The minimum foil thickness of materials of various effective atomic numbers on the semiconductor GaAs support is determined. Their structure can be studied by the positron-spectroscopy method with the **2**2Na( beta ** plus , gamma ) emitter.

Язык оригинала	Английский
Страницы (с-по)	145-151
Число страниц	7
Журнал	Physica Status Solidi (A) Applied Research
Том	71
Номер выпуска	1
Состояние	Опубликовано - мая 1982

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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Pogrebnyak, A. D., Kuzminikh, V. A., & Arefev, K. P. (1982). POSITRON PROFILES AND POSITRON ANNIHILATION IN THIN LAYERS. Physica Status Solidi (A) Applied Research, 71(1), 145-151.

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