Positron annihilation in silicon crystals with mechanically processed surfaces

K. P. Arefiev, A. S. Karetnikov, S. A. Vorobiev

Отделение математики и информатики

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

The angular correlation curves of the annihilation photons and the probability of three-quantum annihilation in silicon single crystals with mechanically processed surfaces were measured. The narrowing of the angular correlation curves increases and the three-quantum yield decreases with the depth of the surface abrasion. This is tentatively interpreted in terms of formation of positronium states on the surface of the silicon crystals.

Язык оригинала	Английский
Страницы (с-по)	273-276
Число страниц	4
Журнал	Applied Physics
Том	8
Номер выпуска	3
DOI	https://doi.org/10.1007/BF00896622
Состояние	Опубликовано - ноя 1975

ASJC Scopus subject areas

Materials Science(all)
Physics and Astronomy(all)
Physics and Astronomy (miscellaneous)
Atomic and Molecular Physics, and Optics

Доступ к документу

10.1007/BF00896622

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abstract = "The angular correlation curves of the annihilation photons and the probability of three-quantum annihilation in silicon single crystals with mechanically processed surfaces were measured. The narrowing of the angular correlation curves increases and the three-quantum yield decreases with the depth of the surface abrasion. This is tentatively interpreted in terms of formation of positronium states on the surface of the silicon crystals.",

keywords = "Positron annihilation, Positronium states, Silicon crystals",

author = "Arefiev, {K. P.} and Karetnikov, {A. S.} and Vorobiev, {S. A.}",

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AU - Arefiev, K. P.

AU - Karetnikov, A. S.

AU - Vorobiev, S. A.

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N2 - The angular correlation curves of the annihilation photons and the probability of three-quantum annihilation in silicon single crystals with mechanically processed surfaces were measured. The narrowing of the angular correlation curves increases and the three-quantum yield decreases with the depth of the surface abrasion. This is tentatively interpreted in terms of formation of positronium states on the surface of the silicon crystals.

AB - The angular correlation curves of the annihilation photons and the probability of three-quantum annihilation in silicon single crystals with mechanically processed surfaces were measured. The narrowing of the angular correlation curves increases and the three-quantum yield decreases with the depth of the surface abrasion. This is tentatively interpreted in terms of formation of positronium states on the surface of the silicon crystals.

KW - Positron annihilation

KW - Positronium states

KW - Silicon crystals

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