K. P. Aref'ev, S. A. Vorob'ev, E. P. Prokop'ev, A. A. Tsoi

Результат исследований: Материалы для книги/типы отчетовГлава


A narrow component in the correlation curves of the annihilation radiation of positrons in silicon crystals was observed when a static magnetic field up to 12 kG was applied. Irradiation of the silicon with 2. 0 MeV electrons increased the strength of the narrow component. The effect was strongest when the samples were cooled to 80 degree K. A model of a positronium atom as an impurity atom with a deep level in the semiconductor energy gap is considered. It is proposed that positronium atoms in irradiated silicon are most probably localized in A vacancy centers, and this produces an anomalously strong ″magnetic quenching″ of their ortho-states.

Язык оригиналаАнглийский
Название основной публикацииSov Phys Solid State
Число страниц3
СостояниеОпубликовано - авг 1977

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Подробные сведения о темах исследования «POSITRON ANNIHILATION IN ELECTRON-IRRADIATED SILICON.». Вместе они формируют уникальный семантический отпечаток (fingerprint).

  • Цитировать

    Aref'ev, K. P., Vorob'ev, S. A., Prokop'ev, E. P., & Tsoi, A. A. (1977). POSITRON ANNIHILATION IN ELECTRON-IRRADIATED SILICON. В Sov Phys Solid State (8 ред., Том 19, стр. 1369-1371)