Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation

Anton S. Brichkov, Victoria Y. Brichkova, Lidia A. Egorova, Vladimir V. Kozik, Vladimir K. Ivanov

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Выдержка

    The paper studies the formation of thin-film and disperse SiO2-MxOy systems (where M - Mn, Fe, Co, Ni) synthesized with sol-gel technology. The influence of metal salt on tetraethoxysilane hydrolysis and film-forming solution viscosity is considered. Dependence of the film optical properties on their composition was determined. According to the electronic scanning microscopy, obtained with a secondary electrons detector, the films containing nickel, mangaese and cobalt have homogeneous morphology and contain pores, sized 100 nm-1 μm, evenly distributed on the surface. The pores contain well crystallized metal oxide nanoparticles.

    Язык оригиналаАнглийский
    Название основной публикацииKey Engineering Materials
    ИздательTrans Tech Publications Ltd
    Страницы44-48
    Число страниц5
    Том670
    ISBN (печатное издание)9783038356127
    DOI
    СостояниеОпубликовано - 2015
    СобытиеInternational Scientific Conference on Multifunctional Chemical Materials and Technologies, MCMT 2015 - Tomsk, Российская Федерация
    Продолжительность: 21 мая 201522 мая 2015

    Серия публикаций

    НазваниеKey Engineering Materials
    Том670
    ISSN (печатное издание)10139826

    Другое

    ДругоеInternational Scientific Conference on Multifunctional Chemical Materials and Technologies, MCMT 2015
    СтранаРоссийская Федерация
    ГородTomsk
    Период21.5.1522.5.15

    Отпечаток

    Metals
    Thin films
    Cobalt
    Nickel
    Oxides
    Sol-gels
    Hydrolysis
    Microscopic examination
    Optical properties
    Salts
    Viscosity
    Nanoparticles
    Detectors
    Scanning
    Electrons
    Chemical analysis
    Polymers
    tetraethoxysilane

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

    Цитировать

    Brichkov, A. S., Brichkova, V. Y., Egorova, L. A., Kozik, V. V., & Ivanov, V. K. (2015). Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. В Key Engineering Materials (Том 670, стр. 44-48). (Key Engineering Materials; Том 670). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.670.44

    Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. / Brichkov, Anton S.; Brichkova, Victoria Y.; Egorova, Lidia A.; Kozik, Vladimir V.; Ivanov, Vladimir K.

    Key Engineering Materials. Том 670 Trans Tech Publications Ltd, 2015. стр. 44-48 (Key Engineering Materials; Том 670).

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Brichkov, AS, Brichkova, VY, Egorova, LA, Kozik, VV & Ivanov, VK 2015, Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. в Key Engineering Materials. том. 670, Key Engineering Materials, том. 670, Trans Tech Publications Ltd, стр. 44-48, Tomsk, Российская Федерация, 21.5.15. https://doi.org/10.4028/www.scientific.net/KEM.670.44
    Brichkov AS, Brichkova VY, Egorova LA, Kozik VV, Ivanov VK. Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. В Key Engineering Materials. Том 670. Trans Tech Publications Ltd. 2015. стр. 44-48. (Key Engineering Materials). https://doi.org/10.4028/www.scientific.net/KEM.670.44
    Brichkov, Anton S. ; Brichkova, Victoria Y. ; Egorova, Lidia A. ; Kozik, Vladimir V. ; Ivanov, Vladimir K. / Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. Key Engineering Materials. Том 670 Trans Tech Publications Ltd, 2015. стр. 44-48 (Key Engineering Materials).
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    AU - Kozik, Vladimir V.

    AU - Ivanov, Vladimir K.

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