Аннотация
An on-line control method of crystal deflector quality based on parametric X-ray radiation is proposed. The technique considered will allow information to be received about the state of the deflector crystal structure directly in the local interaction area of the beam and the crystal.
Язык оригинала | Английский |
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Страницы (с-по) | 3876-3880 |
Число страниц | 5 |
Журнал | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Том | 266 |
Номер выпуска | 17 |
DOI | |
Состояние | Опубликовано - сен 2008 |
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces