Observation of monochromatic and tunable hard X radiation from stratified Si single crystals

Y. Takashima, K. Aramitsu, I. Endo, A. Fukumi, K. Goto, T. Horiguchi, T. Isshiki, V. Kaplin, T. Kobayashi, T. Kondo, K. Matsukado, M. Muto, K. Nakayama, H. Nitta, Y. Okazaki, A. Potylitsin, T. Takahashi, K. Yoshida

Результат исследований: Материалы для журналаСтатья

27 Цитирования (Scopus)

Выдержка

X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.

Язык оригиналаАнглийский
Страницы (с-по)25-30
Число страниц6
ЖурналNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Том145
Номер выпуска1-2
DOI
СостояниеОпубликовано - 2 окт 1998

Отпечаток

Single crystals
Radiation
X rays
single crystals
radiation
x rays
Bragg angle
Storage rings
Synchrotron radiation
Metal foil
Luminance
foils
synchrotron radiation
brightness
Photons
Electrons
photons
electrons

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Цитировать

Observation of monochromatic and tunable hard X radiation from stratified Si single crystals. / Takashima, Y.; Aramitsu, K.; Endo, I.; Fukumi, A.; Goto, K.; Horiguchi, T.; Isshiki, T.; Kaplin, V.; Kobayashi, T.; Kondo, T.; Matsukado, K.; Muto, M.; Nakayama, K.; Nitta, H.; Okazaki, Y.; Potylitsin, A.; Takahashi, T.; Yoshida, K.

В: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Том 145, № 1-2, 02.10.1998, стр. 25-30.

Результат исследований: Материалы для журналаСтатья

Takashima, Y, Aramitsu, K, Endo, I, Fukumi, A, Goto, K, Horiguchi, T, Isshiki, T, Kaplin, V, Kobayashi, T, Kondo, T, Matsukado, K, Muto, M, Nakayama, K, Nitta, H, Okazaki, Y, Potylitsin, A, Takahashi, T & Yoshida, K 1998, 'Observation of monochromatic and tunable hard X radiation from stratified Si single crystals', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, том. 145, № 1-2, стр. 25-30. https://doi.org/10.1016/S0168-583X(98)00225-0
Takashima, Y. ; Aramitsu, K. ; Endo, I. ; Fukumi, A. ; Goto, K. ; Horiguchi, T. ; Isshiki, T. ; Kaplin, V. ; Kobayashi, T. ; Kondo, T. ; Matsukado, K. ; Muto, M. ; Nakayama, K. ; Nitta, H. ; Okazaki, Y. ; Potylitsin, A. ; Takahashi, T. ; Yoshida, K. / Observation of monochromatic and tunable hard X radiation from stratified Si single crystals. В: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 1998 ; Том 145, № 1-2. стр. 25-30.
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abstract = "X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the {"}Bragg angle{"}. The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.",
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T1 - Observation of monochromatic and tunable hard X radiation from stratified Si single crystals

AU - Takashima, Y.

AU - Aramitsu, K.

AU - Endo, I.

AU - Fukumi, A.

AU - Goto, K.

AU - Horiguchi, T.

AU - Isshiki, T.

AU - Kaplin, V.

AU - Kobayashi, T.

AU - Kondo, T.

AU - Matsukado, K.

AU - Muto, M.

AU - Nakayama, K.

AU - Nitta, H.

AU - Okazaki, Y.

AU - Potylitsin, A.

AU - Takahashi, T.

AU - Yoshida, K.

PY - 1998/10/2

Y1 - 1998/10/2

N2 - X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.

AB - X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.

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