We have observed the emission of 15 keV x rays produced by 500 MeV electrons passing through a x-ray multilayer mirror. The mirror consisted of 300 pairs of W and B4C layers with layer spacing of 12.36 Å and supported by a 100 μm Si substrate. The x rays were emitted at the Bragg angle θγ = 33.15 mrad with respect to the mirror surface and at the angle γD = 66.3 mrad with respect to the electron-beam direction. The spatial distribution and the spectral angular dependence of the x rays were measured and shown to be larger than the parametric x rays emitted from the Si substrate. The value of the differential photon efficiency was estimated to be about 0.22 photons/electron/str.
|Журнал||Applied Physics Letters|
|Состояние||Опубликовано - 12 июн 2000|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)