Network vulnerability in two-phase evolution

N. A. Kinash, A. I. Trufanov, A. A. Tikhomirov, O. G. Berestneva, O. N. Fisochenko

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

1 Цитирования (Scopus)

Аннотация

Contrary to traditional evolutionary models of complex networks a novel consideration with two-formation & degradation - phases has been proposed. To clarify which of the stages of the phases are more sensible the evolving network has been put to simulated attacks. A novel integral vulnerability metrics has been proposed which demonstrated strong dependence on the network growth rate of the stage put under short time attacks. It was found that the higher the rate is the higher pertinent vulnerability is observed. The study gives a dynamic scope for future analysis of network security, hints to build resilient network systems, and ways to perform network management effectively.

Язык оригиналаАнглийский
Название основной публикации2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings
ИздательInstitute of Electrical and Electronics Engineers Inc.
ISBN (электронное издание)9781467383837
DOI
СостояниеОпубликовано - 14 июн 2016
Событие2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Moscow, Российская Федерация
Продолжительность: 12 мая 201614 мая 2016

Другое

Другое2016 International Siberian Conference on Control and Communications, SIBCON 2016
СтранаРоссийская Федерация
ГородMoscow
Период12.5.1614.5.16

ASJC Scopus subject areas

  • Signal Processing
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation
  • Computer Networks and Communications

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  • Цитировать

    Kinash, N. A., Trufanov, A. I., Tikhomirov, A. A., Berestneva, O. G., & Fisochenko, O. N. (2016). Network vulnerability in two-phase evolution. В 2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings [7491785] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SIBCON.2016.7491785