Multilevel hierarchical structure formed in the film (Ti)/substrate (SiC-ceramics) system under irradiation by an intense pulsed electron beam

Yurii Ivanov, Vladimir Shugurov, Mark Kalashnikov, Andrey Leonov, Anton Teresov, Maria Petukevich, Valentina Polisadova

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

The aim of this study was the formation of multilevel hierarchical structure in the SiC ceramics surface layer as a result melting of the film (Ti)/substrate (SiC-ceramics) system by an intense pulsed electron beam. SiC ceramics samples obtained by SPS-sintering were used. Titanium film of 0.5 μm was formed by vacuum electric-arc plasma-assisted spraying of cathode from VT1-0 technical-grade titanium. Irradiation of the film/substrate system was carried out with an intense pulsed electron beam of submillisecond duration with the following parameters: accelerated electron energy 17 keV, electron beam energy density 15 J/cm2, pulse duration 200 μs, quantity of pulses 30, and residual gas (argon) pressure in the working chamber 0.03 Pa. As a result of completed studies formation of multilevel multiphase submicro-nanocrystalline hierarchical structure with microhardness in the range from 35 to 96 GPa was found, repeatedly exceeding the microhardness of the initial SiC ceramics.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
РедакторыVasily M. Fomin, Victor E. Panin, Sergey G. Psakhie
ИздательAmerican Institute of Physics Inc.
Том2051
ISBN (электронное издание)9780735417779
DOI
СостояниеОпубликовано - 12 дек 2018
СобытиеInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018 - Tomsk, Российская Федерация
Продолжительность: 1 окт 20185 окт 2018

Конференция

КонференцияInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018
СтранаРоссийская Федерация
ГородTomsk
Период1.10.185.10.18

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Цитировать

    Ivanov, Y., Shugurov, V., Kalashnikov, M., Leonov, A., Teresov, A., Petukevich, M., & Polisadova, V. (2018). Multilevel hierarchical structure formed in the film (Ti)/substrate (SiC-ceramics) system under irradiation by an intense pulsed electron beam. В V. M. Fomin, V. E. Panin, & S. G. Psakhie (Ред.), Proceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Том 2051). [020110] American Institute of Physics Inc.. https://doi.org/10.1063/1.5083353