Modification of optical and electrical properties of SnO2 under the influence of argon ion beam

S. Umnov, O. Asainov, V. Temenkov

Результат исследований: Материалы для журналаСтатья

Выдержка

Thin films of tin oxide were deposited on the glass substrates at a room temperature using reactive magnetron sputtering. The ratio between O2/Ar and the discharge voltage is maintained in such a mode when the deposited films are dielectrics. After the deposition, the films were irradiated with an argon ions beam. The modification of the optical and electrical properties of the films depending on the irradiation time was studied. Optical properties of the films were analyzed in the range of 300-1100 nm using photometry and structural X-ray diffraction. The diffractometric research showed that the films, deposited on a substrate, had a crystal structure, and after argon ions irradiation they became quasi-crystalline (amorphous). It was found that the modification in the transmittance was correlated with modifications in the meaning of surface resistance. The dielectrics films SnO2 with increasing exposure time became conductive and then the electrical resistance decreased and reached a minimum at 13.2 seconds. Then resistance films began to increase.

Язык оригиналаАнглийский
Номер статьи012077
ЖурналJournal of Physics: Conference Series
Том830
Номер выпуска1
DOI
СостояниеОпубликовано - 4 мая 2017
Событие5th International Congress on Energy Fluxes and Radiation Effects 2016, EFRE 2016 - Tomsk, Российская Федерация
Продолжительность: 2 окт 20167 окт 2016

Отпечаток

ion beams
electrical properties
argon
optical properties
electrical resistance
ion irradiation
tin oxides
photometry
transmittance
magnetron sputtering
crystal structure
irradiation
glass
electric potential
room temperature
thin films
diffraction
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Цитировать

Modification of optical and electrical properties of SnO2 under the influence of argon ion beam. / Umnov, S.; Asainov, O.; Temenkov, V.

В: Journal of Physics: Conference Series, Том 830, № 1, 012077, 04.05.2017.

Результат исследований: Материалы для журналаСтатья

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