Modification of diode x-rays by electron multiple backscatter from anode

V. V. Ryzhov, V. I. Bespalov, A. V. Kirikov, I. Yu Turchanovsky, V. P. Tarakanov

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

In high-power vacuum diodes with high-atomic-number anodes, a large fraction of the electrons are backscattered, thus changing all diode characteristics: the electron and ion currents [1,2], the electron beam spectrum [3], and, finally, the X-ray spectrum and the X-ray efficiency. The latter problem is very important for intense electron beam radiography. Based on the KARAT [4] and Monte Carlo [5] codes, a hybrid PIC/Monte Carlo code is now being.. developed to examine the above problems. The results of computer simulations are compared with experimental data.

Язык оригиналаАнглийский
Название основной публикацииPPPS 2001 - Pulsed Power Plasma Science 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы1336-1339
Число страниц4
Том2
ISBN (печатное издание)0780371208, 9780780371200
DOI
СостояниеОпубликовано - 2001
Событие28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, Соединенные Штаты Америки
Продолжительность: 17 июн 200122 июн 2001

Другое

Другое28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
СтранаСоединенные Штаты Америки
ГородLas Vegas
Период17.6.0122.6.01

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

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  • Цитировать

    Ryzhov, V. V., Bespalov, V. I., Kirikov, A. V., Turchanovsky, I. Y., & Tarakanov, V. P. (2001). Modification of diode x-rays by electron multiple backscatter from anode. В PPPS 2001 - Pulsed Power Plasma Science 2001 (Том 2, стр. 1336-1339). [1001797] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPPS.2001.1001797