Micron size laser-wire system at the ATF extraction line

A. Aryshev, G. A. Blair, S. T. Boogert, G. Boorman, A. Bosco, L. Deacon, P. Karataev, D. Howell, L. J. Nevay, L. Corner, N. Delerue, B. Foster, F. Gannaway, M. Newman, R. Senanayake, R. Walczak, H. Hayano, N. Terunuma, J. Urakawa

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

3 Цитирования (Scopus)

Выдержка

The KEK Accelerator test facility (ATF) extraction line laser-wire system has recently been upgraded allowing the measurement of micron scale transverse size electron beams. We report on the hardware upgrades, including focusing lens, laser diagnostics and mechanical systems. The first measurements using the new system from recent operation at the ATF are presented.

Язык оригиналаАнглийский
Название основной публикацииEPAC 2008 - Contributions to the Proceedings
ИздательEuropean Physical Society Accelerator Group (EPS-AG)
Страницы1065-1067
Число страниц3
СостояниеОпубликовано - 2008
Опубликовано для внешнего пользованияДа
Событие11th European Particle Accelerator Conference, EPAC 2008 - Genoa, Италия
Продолжительность: 23 июн 200827 июн 2008

Конференция

Конференция11th European Particle Accelerator Conference, EPAC 2008
СтранаИталия
ГородGenoa
Период23.6.0827.6.08

Отпечаток

test facilities
accelerators
wire
lasers
hardware
lenses
electron beams

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Цитировать

Aryshev, A., Blair, G. A., Boogert, S. T., Boorman, G., Bosco, A., Deacon, L., ... Urakawa, J. (2008). Micron size laser-wire system at the ATF extraction line. В EPAC 2008 - Contributions to the Proceedings (стр. 1065-1067). European Physical Society Accelerator Group (EPS-AG).

Micron size laser-wire system at the ATF extraction line. / Aryshev, A.; Blair, G. A.; Boogert, S. T.; Boorman, G.; Bosco, A.; Deacon, L.; Karataev, P.; Howell, D.; Nevay, L. J.; Corner, L.; Delerue, N.; Foster, B.; Gannaway, F.; Newman, M.; Senanayake, R.; Walczak, R.; Hayano, H.; Terunuma, N.; Urakawa, J.

EPAC 2008 - Contributions to the Proceedings. European Physical Society Accelerator Group (EPS-AG), 2008. стр. 1065-1067.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Aryshev, A, Blair, GA, Boogert, ST, Boorman, G, Bosco, A, Deacon, L, Karataev, P, Howell, D, Nevay, LJ, Corner, L, Delerue, N, Foster, B, Gannaway, F, Newman, M, Senanayake, R, Walczak, R, Hayano, H, Terunuma, N & Urakawa, J 2008, Micron size laser-wire system at the ATF extraction line. в EPAC 2008 - Contributions to the Proceedings. European Physical Society Accelerator Group (EPS-AG), стр. 1065-1067, Genoa, Италия, 23.6.08.
Aryshev A, Blair GA, Boogert ST, Boorman G, Bosco A, Deacon L и соавт. Micron size laser-wire system at the ATF extraction line. В EPAC 2008 - Contributions to the Proceedings. European Physical Society Accelerator Group (EPS-AG). 2008. стр. 1065-1067
Aryshev, A. ; Blair, G. A. ; Boogert, S. T. ; Boorman, G. ; Bosco, A. ; Deacon, L. ; Karataev, P. ; Howell, D. ; Nevay, L. J. ; Corner, L. ; Delerue, N. ; Foster, B. ; Gannaway, F. ; Newman, M. ; Senanayake, R. ; Walczak, R. ; Hayano, H. ; Terunuma, N. ; Urakawa, J. / Micron size laser-wire system at the ATF extraction line. EPAC 2008 - Contributions to the Proceedings. European Physical Society Accelerator Group (EPS-AG), 2008. стр. 1065-1067
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abstract = "The KEK Accelerator test facility (ATF) extraction line laser-wire system has recently been upgraded allowing the measurement of micron scale transverse size electron beams. We report on the hardware upgrades, including focusing lens, laser diagnostics and mechanical systems. The first measurements using the new system from recent operation at the ATF are presented.",
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AU - Aryshev, A.

AU - Blair, G. A.

AU - Boogert, S. T.

AU - Boorman, G.

AU - Bosco, A.

AU - Deacon, L.

AU - Karataev, P.

AU - Howell, D.

AU - Nevay, L. J.

AU - Corner, L.

AU - Delerue, N.

AU - Foster, B.

AU - Gannaway, F.

AU - Newman, M.

AU - Senanayake, R.

AU - Walczak, R.

AU - Hayano, H.

AU - Terunuma, N.

AU - Urakawa, J.

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