Method of state and alignment monitoring for crystal deflectors of relativistic ions

A. Gogolev, S. Uglov, A. Taratin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

1 Цитирования (Scopus)

Аннотация

The calculations of the parametric X-ray radiation (PXR) characteristics produced by 158 GeV/u Pb nuclei in silicon crystal deflectors were carried out. The PXR intensity at the maximum angular distribution was about 4 ph/Pb/sr, which should allow to monitor the state and the orientation of the deflector by means of the observation of the PXR spectrum characteristics.

Язык оригиналаАнглийский
Название основной публикацииRuPAC 2012 Contributions to the Proceedings - 23rd Russian Particle Accelerator Conference
Страницы200-202
Число страниц3
СостояниеОпубликовано - 2012
Событие23rd Russian Particle Accelerator Conference, RuPAC 2012 - Saint-Petersburg, Российская Федерация
Продолжительность: 24 сен 201228 сен 2012

Другое

Другое23rd Russian Particle Accelerator Conference, RuPAC 2012
СтранаРоссийская Федерация
ГородSaint-Petersburg
Период24.9.1228.9.12

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Цитировать

Gogolev, A., Uglov, S., & Taratin, A. (2012). Method of state and alignment monitoring for crystal deflectors of relativistic ions. В RuPAC 2012 Contributions to the Proceedings - 23rd Russian Particle Accelerator Conference (стр. 200-202)