METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

V. A. Lisin, Yu M. Stepanov, A. P. Yalovets

    Результат исследования: Материалы для книги/типы отчетовМатериалы для конференции

    Аннотация

    A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    Язык оригиналаАнглийский
    Заголовок главной публикацииThe Soviet journal of nondestructive testing
    Страницы902-905
    Количество страниц4
    Том17
    Редакция12
    Статус публикацииОпубликовано - дек 1981

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    ASJC Scopus subject areas

    • Engineering(all)

    Цитировать

    Lisin, V. A., Stepanov, Y. M., & Yalovets, A. P. (1981). METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. В The Soviet journal of nondestructive testing (12 ред., Том 17, стр. 902-905)