METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

V. A. Lisin, Yu M. Stepanov, A. P. Yalovets

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Выдержка

    A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    Язык оригиналаАнглийский
    Название основной публикацииThe Soviet journal of nondestructive testing
    Страницы902-905
    Число страниц4
    Том17
    Издание12
    СостояниеОпубликовано - дек 1981

    Отпечаток

    Atoms
    Electrons
    Inspection

    ASJC Scopus subject areas

    • Engineering(all)

    Цитировать

    Lisin, V. A., Stepanov, Y. M., & Yalovets, A. P. (1981). METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. В The Soviet journal of nondestructive testing (12 ред., Том 17, стр. 902-905)

    METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. / Lisin, V. A.; Stepanov, Yu M.; Yalovets, A. P.

    The Soviet journal of nondestructive testing. Том 17 12. ред. 1981. стр. 902-905.

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Lisin, VA, Stepanov, YM & Yalovets, AP 1981, METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. в The Soviet journal of nondestructive testing. 12 ред., том. 17, стр. 902-905.
    Lisin VA, Stepanov YM, Yalovets AP. METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. В The Soviet journal of nondestructive testing. 12 ред. Том 17. 1981. стр. 902-905
    Lisin, V. A. ; Stepanov, Yu M. ; Yalovets, A. P. / METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. The Soviet journal of nondestructive testing. Том 17 12. ред. 1981. стр. 902-905
    @inproceedings{98295dc546884ee680174197d1697bd8,
    title = "METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.",
    abstract = "A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.",
    author = "Lisin, {V. A.} and Stepanov, {Yu M.} and Yalovets, {A. P.}",
    year = "1981",
    month = "12",
    language = "English",
    volume = "17",
    pages = "902--905",
    booktitle = "The Soviet journal of nondestructive testing",
    edition = "12",

    }

    TY - GEN

    T1 - METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

    AU - Lisin, V. A.

    AU - Stepanov, Yu M.

    AU - Yalovets, A. P.

    PY - 1981/12

    Y1 - 1981/12

    N2 - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    AB - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    UR - http://www.scopus.com/inward/record.url?scp=4243368762&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=4243368762&partnerID=8YFLogxK

    M3 - Conference contribution

    AN - SCOPUS:4243368762

    VL - 17

    SP - 902

    EP - 905

    BT - The Soviet journal of nondestructive testing

    ER -