Mesoscopic investigation of plastic deformation at compositions extension with intermetallic coating laid by method of electron-beam melting

S. V. Panin, Sh A. Baibulatov, V. G. Durakov

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The authors investigated electron beam melting (EBM)-compositions with intermetallic coatings on the basis of PT-Yu10N powder, coating of Ni-Al system, used as a rule for coating sublayers increasing strength of coatings and base adherence. For certification of such compositions optical-television complex of high resolution TOMSC was used allowing investigations of the behavior of loaded material on meso and macroscopic scaled levels to be performed.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы125-127
Число страниц3
ISBN (печатное издание)0780363469, 9780780363465
DOI
СостояниеОпубликовано - 2001
Событие7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Российская Федерация
Продолжительность: 26 фев 20012 мар 2001

Другое

Другое7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
СтранаРоссийская Федерация
ГородTomsk
Период26.2.012.3.01

ASJC Scopus subject areas

  • Biotechnology
  • Computer Science Applications
  • Civil and Structural Engineering
  • Mechanical Engineering
  • Materials Science (miscellaneous)
  • Instrumentation
  • Education

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  • Цитировать

    Panin, S. V., Baibulatov, S. A., & Durakov, V. G. (2001). Mesoscopic investigation of plastic deformation at compositions extension with intermetallic coating laid by method of electron-beam melting. В Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (стр. 125-127). [983765] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983765