Localized high field enhancements from hemispherical 3D mesoscale dielectric particles in the refection mode

Igor V. Minin, Oleg V. Minin, Nikita A. Kharitoshin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

3 Цитирования (Scopus)

Аннотация

In this paper the formation of photonic jet is demonstrated using 3D dielectric hemispheres working in 'refection' mode when the specific spatially localized region is localized towards the direction of incidence wavefront. The results of simulation based on Finite Integration Technique are discussed. All dimensions are given in wavelength units so that all results can be scaled to any frequency of interest including optical frequencies, simplifying the fabrication process compared with spherical dielectrics. The results here presented may be of interest for novel applications including microscopy techniques and sensors.

Язык оригиналаАнглийский
Название основной публикации2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Proceedings
ИздательIEEE Computer Society
Страницы331-333
Число страниц3
Том2015-August
ISBN (электронное издание)9781467367196
DOI
СостояниеОпубликовано - 10 авг 2015
Опубликовано для внешнего пользованияДа
Событие16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Erlagol, Altai, Российская Федерация
Продолжительность: 29 июн 20153 июл 2015

Конференция

Конференция16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015
СтранаРоссийская Федерация
ГородErlagol, Altai
Период29.6.153.7.15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Цитировать

    Minin, I. V., Minin, O. V., & Kharitoshin, N. A. (2015). Localized high field enhancements from hemispherical 3D mesoscale dielectric particles in the refection mode. В 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Proceedings (Том 2015-August, стр. 331-333). [7184556] IEEE Computer Society. https://doi.org/10.1109/EDM.2015.7184556