Laser monitor for imaging of the processes located at different distances

Maxim V. Trigub, Kirill V. Fedorov, Vasiliy V. Vlasov, Gennadiy S. Evtushenko

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

Actual methods of the long lasing pulse obtaining in CuBr active medium was observed. A compact pump source, which can be used in mode with low energy input in the discherge was developed. The source is stable working in low frequencies (2-3 kHz) and allows to achieve a pulse duration up to 100 ns. Moreover, this source allows to operate with the pulse repetition frequency of up to 50 kHz. Developed device was used to study the influence of the distance between the observed object and the brightness amplifier on the image quality and on the process of signal amplification in active medium. In case of working in the mode with atypical duration of laser pulse it is became possible to image the objects at a distance up to 9 meters with no loss in images quality.

Язык оригиналаАнглийский
Название основной публикации2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings
ИздательIEEE Computer Society
Страницы295-299
Число страниц5
Том2016-August
ISBN (электронное издание)9781509007868
DOI
СостояниеОпубликовано - 9 авг 2016
Событие17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Erlagol, Altai, Российская Федерация
Продолжительность: 30 июн 20164 июл 2016

Конференция

Конференция17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016
СтранаРоссийская Федерация
ГородErlagol, Altai
Период30.6.164.7.16

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Цитировать

Trigub, M. V., Fedorov, K. V., Vlasov, V. V., & Evtushenko, G. S. (2016). Laser monitor for imaging of the processes located at different distances. В 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings (Том 2016-August, стр. 295-299). [7538744] IEEE Computer Society. https://doi.org/10.1109/EDM.2016.7538744