An investigation was made of the temperature dependence of the kinetics of dissociation of previously introduced M centers in MgF//2 by irradiation with nanosecond electron pulses. The dissociation of the M centers was the result of two processes, one of which was fast and temperature-independent and the other slow and temperature-dependent. An analysis of the experimental results indicated that the activation energy of the fast process decreased with time from the beginning of the electron pulse ranging from 0. 19 plus or minus 0. 04 eV for t equals 20 nsec to a 0. 1 plus or minus 0. 02 eV at t equals 1000 nsec which agreed (within the experimental error) to that obtained as a result of continuous irradiation. These results were explained using the theory of the thermally activated spatial separation of the components of the primary F-H pairs. The activation energies of the spatial separation and migration of the H centers were found to be 0. 09 plus or minus 0. 04 and 0. 1 plus or minus 0. 02 eV, respectively.
|Название основной публикации||Sov Phys Solid State|
|Состояние||Опубликовано - мар 1978|
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