Investigation of the morphology and elemental composition of the silicon-containing calcium phosphate coating treated by intensive pulsed electron beam

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The surface of titanium substrate with calcium phosphate (CaP) coating prepared by RF magnetron sputtering was treated by a pulsed electron beam with an energy density of 0.8-8 J/cm2. A partial or complete intermixing of the surface layers of the system CaP-titanium was observed. Significant changes in the topography of the formed surfaces were revealed. Treatment conditions with an energy density of 0.8 and 3 J/cm2 led to the thermal annealing of the coating. The use of beam parameters with an energy density of 6.5 and 8 J/cm2 led to the partial vaporization and intermixing of the coating with a titanium matrix.

Язык оригиналаАнглийский
Название основной публикации2014 9th International Forum on Strategic Technology, IFOST 2014
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы429-431
Число страниц3
ISBN (печатное издание)9781479960620
DOI
СостояниеОпубликовано - 17 дек 2014
Событие9th International Forum on Strategic Technology, IFOST 2014 - Cox's Bazar, Бангладеш
Продолжительность: 21 окт 201423 окт 2014

Другое

Другое9th International Forum on Strategic Technology, IFOST 2014
СтранаБангладеш
ГородCox's Bazar
Период21.10.1423.10.14

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Civil and Structural Engineering
  • Building and Construction
  • Fuel Technology
  • Computer Networks and Communications

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    Chudinova, E. A., Surmeneva, M. A., Grubova, I. Y., Priamushko, T. S., Pushilina, N. S., Teresov, A. D., Koval, N. N., Prymak, O., Epple, M., & Surmenev, R. A. (2014). Investigation of the morphology and elemental composition of the silicon-containing calcium phosphate coating treated by intensive pulsed electron beam. В 2014 9th International Forum on Strategic Technology, IFOST 2014 (стр. 429-431). [6991155] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IFOST.2014.6991155